Electrical characterization of metal/diamond-like carbon/inorganic semiconductor MIS Schottky barrier diodes


Basman N., Aslan N., UZUN O., ÇANKAYA G., KÖLEMEN U.

Microelectronic Engineering, cilt.140, ss.18-22, 2015 (SCI-Expanded, Scopus) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 140
  • Basım Tarihi: 2015
  • Doi Numarası: 10.1016/j.mee.2015.05.001
  • Dergi Adı: Microelectronic Engineering
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.18-22
  • Anahtar Kelimeler: Diamond-like carbon, MIS Schottky diode, Pressure sensor
  • Samsun Üniversitesi Adresli: Hayır

Özet

In this study, electrodeposited diamond-like carbon (DLC) film was used to fabricate 12 identical Au/DLC/p-Si metal-interlayer-semiconductor (MIS) Schottky diodes. Current-voltage (I-V) measurements were carried out to obtain diodes' parameters. The rectification ratios of the MIS diodes were found between 103 and 104. By using the forward bias I-V characteristics, the average ideality factor (n) and barrier height (Φb) values of Au/DLC/p-Si MIS structures were found as 2.06 and 0.84 eV, respectively. The Φb value of 0.84 eV obtained for Au/DLC/p-Si MIS diode was much higher than the value of 0.34 of conventional Au/p-Si Schottky diode. Cheung-Cheung functions were also used to extract barrier height and series resistance values and the obtained results were compared with I-V method. I-V measurements were also carried out under the hydrostatic pressure in the range of 0.0-2.0 kbar. It was found that barrier height and series resistance values were highly pressure sensitive and increased with the ascending pressure. It was proposed that Au/DLC/p-Si Schottky MIS diode can be used as pressure sensor due to high sensitivity to changing pressure.