A new approach for parameter extraction of complex models and an application for SPICE MOSFET level-3 static model

Yazgı M., Kuntman H.

Microelectronics Journal, cilt.30, sa.2, ss.149-155, 1999 (SCI-Expanded, Scopus) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 30 Sayı: 2
  • Basım Tarihi: 1999
  • Doi Numarası: 10.1016/s0026-2692(98)00101-3
  • Dergi Adı: Microelectronics Journal
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.149-155
  • Samsun Üniversitesi Adresli: Hayır

Özet

In this work, a new approach is presented for specifying the error term used in the parameter extraction algorithms. By using the new approach, it is possible to remove the differential operations in the algorithms used for the extraction of parameters in complex models. Also, we present an iteration procedure obtained by using the new approach for the extraction of SPICE level-3 MOST static model parameters KP, VTH, TETA, VMAX and RS (=RD). As well as the triode region parameters, GAMMA, NFS and KAPPA can be found in the overall procedure. Results of the procedure have been compared with the experimental results. It is obvious from this comparison that the new approach is effective for the determination of level-3 model parameters, as for the determination of parameters of proper models. © 1999 Elsevier Science Ltd.